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JCMsuite Applications in R&D
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software benchmarks
Displaying items by tag: software benchmarks
Computing resonance wavelengths and quality factors in photonic crystal membrane line defect cavities
Published in
2018
Tagged under
integrated optics
optical resonators and antennas
photonic crystals
resonance mode computation
software benchmarks
Read more...
FEM for validation of alternative scattering computation method
Published in
2017
Tagged under
optical metrology and sensing
optical and EUV lithography
other fields
software benchmarks
light scattering computation
Read more...
Optical field and attractive force at a subwavelength slit
Published in
2016
Tagged under
plasmonics
other fields
diffractive optics
advanced finite element methods
light scattering computation
software benchmarks
Read more...
Simulations of high-Q optical nanocavities challenging modeling benchmark
Published in
2013
Tagged under
optical resonators and antennas
photonic crystals
integrated optics
software benchmarks
resonance mode computation
Read more...
Benchmarking FEM vs Fourier Modal Method
Published in
2009
Tagged under
plasmonics
software benchmarks
Read more...
Comparison of electromagnetic field solvers for the 3D analysis of plasmonic nano antennas
Published in
2009
Tagged under
plasmonics
software benchmarks
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Benchmark of rigorous methods for electromagnetic field simulation with application to lithography simulations
Published in
2008
Tagged under
optical and EUV lithography
software benchmarks
Read more...
Benchmark of computational methods for mask simulation in optical lithography
Published in
2005
Tagged under
optical metrology and sensing
optical and EUV lithography
software benchmarks
Read more...
JCMsuite used for Mueller matrix ellipsometry
Published in
2019
Tagged under
optical metrology and sensing
optimization and parameter retrieval methods
software benchmarks
Read more...
Benchmark of Global Optimization Approaches for Nano-optical Shape Optimization and Parameter Reconstruction
Published in
2019
Tagged under
optical metrology and sensing
optical and EUV lithography
metamaterials
quantum optics
optimization and parameter retrieval methods
software benchmarks
Read more...
Gaussian process regression for efficient parameter reconstruction
Published in
2019
Tagged under
optical metrology and sensing
optical and EUV lithography
optimization and parameter retrieval methods
software benchmarks
Read more...
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